Siberian Branch of USSR Academy of Sciences
NOVOSIBIRSK, USSR. January 18, 1977. Engineer T. Mishchenko is working with a unique device called microellipsometer. This device was developed in the Institute of Semiconductor Physics and is intended for control of the production of semiconductors without disrupting the workflow. Anatoly Polyakov/TASS
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Developed Disrupting Intended Novosibirsk Polyakov Semiconductor
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